Rampant counterfeiting in regions such as Asia has made strict research into the documentation and authenticity of chips an essential prerequisite for accepting ICs for integration into manufactured products. E-Certa uses a patent-pending ‘delidding’ process to examine a chip’s internal structure and uses a metallurgical microscope to perform a complete sweep of the sample IC from micromillimeter to micromillimeter, capturing chip images and performing research to ensure that the logo on the chip is authentic.

This article was taken from Global SMT & Packaging Vol. 6 No. 10 - November/December 2006.

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Keywords : Joel Deutsch, delidding, counterfeit components, faulty marking, incorrect components, die identification, XRF testing

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