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3rd International Symposium on Tin Whiskers – Register Now PDF Print E-mail
 

Posted by Jade Po Kellard on 20 May 2009 at 06:00

Tin whiskers remain a serious reliability concern in electronic products and systems. CALCE along with SMTA, the Technical University of Denmark, and Osaka University will hold the Third International Symposium on Tin Whiskers, June 23-24 at the Technical University of Denmark. This symposium will cover case histories, theories of tin  whisker growth, experiments and results, risk evaluation methods, and risk mitigation strategies.

Attendees will be able to learn about the current state of knowledge regarding tin whisker growth, risk, and mitigation strategies, enabling the development of improved and effective qualification and mitigation procedures.

Read more about the symposium agenda.

Registration and hotel information can be found at http://www.smta.org/education/symposia/symposia.cfm#tin-whiskers.

   
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