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Interview—Jeff Timms, Microscan

Posted by hglackey on 17 June 2009 at 15:49

Jeff Timms, president of Microscan since 2007, has been focusing these past two years on using his 25 years of business leadership in global technology and automation to bring the company to the forefront of the precision data acquisition and control solutions industry. Prior to Microscan, Jeff held senior management positions with both Siemens and Universal Instruments. Global SMT & Packaging’s editor-in-chief Trevor Galbraith caught up with Jeff recently.

Read the full interview online.

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