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Global SMT& Packaging
E-mail: news@globalsmt.net
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Editorial Staff
Circulation and Subscriptions
Tel: +44 (0)1458 832137
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@globalsmt.net |
Process and assembly methods for increased yield of PoP devices
Brian Toleno, Ph.D., and Dan Maslyk, Henkel
Increased functionality and smaller devices are significant drivers in innovative packaging designs. One of the newer package types to be introduced into the marketplace in the past few years is the package on package (PoP) device. While the designer is limited in what functionality can be ‘stacked,’ since these come packaged together in a single unit, stacking packages can offer significant advantages from a design standpoint; as long as the pad designs are compatible, different device types can be stacked for more versatility in the design and the assembly. Assembling these devices on a standard SMT line, however, can present challenges. Read
more...
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Challenging times ahead...
Component orders may be exceeding end market demand
Walt Custer and Jon Custer-Topai, Custer Consulting
Regional growth of electronic equipment, semiconductors and printed circuit boards provide timely insight into business conditions in the key electronic centers of the world. Chart 1 shows the 3-month growth of electronic equipment shipments by area. Note Taiwan/China’s large growth-decline (from +36.7% in October’07 to +14.7% in April’08). 14.7% growth is not bad, but for Taiwan & China it is the lowest level since early 2002! Read
more...

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| Global SMT & Packaging magazine |
Inside the June 2008 issue of Global SMT & Packaging magazine:
- "Process and assembly methods for increased yield of PoP devices" by Brian Toleno, Ph.D., and Dan Maslyk
- "Suitable choices for lead-free hand soldering" by Shubo Gao and David M. Jacobson
- "Pushing the barriers of wafer level device integration" by
Gordon Christison
- Albert Bokma, interview—Assembléon
- Case Study: Are two heads really better than one?
- Inovar factory expansion – an American success story
- "Are we there yet? The ongoing journey to co-design of chip, package and substrate" by
Joe Fjelstad (North America edition)
- "Ball grid array & lead-free assembly defects, part 2" by
Bob Willis (Europe edition)
- "First quarter 12% global end market growth slowdown but no disaster on horizon" by
Walt Custer and Jon Custer-Topai
- "Inadequate peak reflow temperatures" by
Werner Engelmaier
Download issue 8.6 - June 2008 today.
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Issue 8.26
July 4, 2008








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