Christopher Hunt, PH.D., and Martin Wickham were awarded Best International Conference Paper at IPC Printed Circuits Expo, APEX and the Designers Summit 2006.

For their presentation of the paper �Impact of Lead Contamination on Reliability of Lead-Free Alloys� Christopher Hunt, PH.D., (and Martin Wickham), National Physical Laboratory, were awarded the Best International Conference Paper at IPC Printed Circuits Expo, APEX and the Designers Summit 2006.

Chris presented his paper on the Friday of APEX in a Lead-Free Reliability session.

A full version is available at http://www.npl.co.uk/ei/studio.